講義ノート

シラバス

時限

火曜日2限(10:15-11:45)

出欠表

出欠表

Course Overvies

Understanding instrumentation, element technologies, and their background concepts used in for the observations in the optical-infrared wavelength.

Schedule

(1) Introduction (2) Ground-based and Space Telescopes (3) Site selection and observational conditions

- Atmospheric disturbance and seeing
- Atmospheric transmittance
- Site evaluation

(4) Optics

- Paraxial theory
- Seidel aberrations
- Chromatic aberration
- Refractive and reflective optics
- Diffraction and Airy pattern

(5) Telescopes

- Cassegrain and Gregorian optics
- Aplanatic optics
- Schmidt camera
- Mirror
- Atmospheric dispersion correction

(6) Detectors

- Photographic plates
- Semiconductor detectors
- Photovoltaic detectors, photo conductive detectors
- CCD and CMOS
- Infrared detectors and hybridization
- Impurity band conduction
- Readout electronics
- kTC noise and CDS

(7) Filters

- Filter sets and magnitude systems
- Color glass
- Fabry-Perot interferometer
- Interference filters
- Anti-reflection coating
- Metal-mesh filters

(8) Dispersers

- Prisms
- Gratings
- Grisms
- Immersion gratings
- VPH gratings

(9) Imagers

- Optical imagers
- Infrared imagers
- Re-imaging and Lyot stop
- Offner optics

(10) Spectrographs

- Multi-object spectrographs
- Integral field spectroscopy
- Optical fibers

(11) Adaptive optics

- Atmospheric disturbance
- Speckles
- Wavefront sensors
- Deformable mirrors
- Laser guide star systems
- Multi-conjugate AO
- Ground-layer AO
- Multi-object AO

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